Altera provides boundary-scan description language (BSDL) files for IEEE Standard 1149.1, IEEE Standard 1149.6 and IEEE Standard 1532 specifications. BSDL files provide a syntax that allows the device to run boundary-scan test (BST) and in-system programmability (ISP). The IEEE 1149.1 BSDL files available on this website are used for pre-configuration BST. If you want to perform BST after configuration, you can use the BSDL Customizer to generate a BSDL file for post-configuration BST. The IEEE 1149.1 BSDL files for new devices can be generated in Quartus® II design software version 8.0 and later. For the steps on generating BSDL files by using Quartus II software, please refer to BSDL Files Generation in QII.
Downloads
- IEEE 1149.1 BSDL Files
- IEEE 1149.6 BSDL Files
- IEEE 1532 BSDL Files
- Solution for Post-configuration BSDL File : BSDLCustomizer (ZIP)
- Preconfig BSDL Customizer (ZIP)
- Basic Boundary-Scan Test Troubleshooting Guideline (PDF)
- FAQs (PDF)
- Generate BSDL (tcl)
Related Documents
- AN 39: IEEE 1149.1 (JTAG) Boundary-Scan Testing in Altera® Devices (PDF)
- IEEE 1149.1 (JTAG) Boundary-Scan Testing for MAX® II Devices (PDF)
- IEEE 1149.1 (JTAG) Boundary Scan Testing for Cyclone® II Devices (PDF)
- IEEE 1149.1 (JTAG) Boundary Scan Testing in Stratix® II & Stratix II GX Devices (PDF)
- IEEE 1149.1 (JTAG) Boundary Scan Testing in Stratix III Devices (PDF)
- JTAG Boundary Scan Testing in Stratix IV Devices (PDF)
- IEEE 1149.1 (JTAG) Boundary Scan Testing for Cyclone III Devices (PDF)
- IEEE 1149.1 (JTAG) Boundary Scan Testing for Arria® GX Devices (PDF)
- JTAG Boundary Scan Testing in Arria II GX Devices (PDF)
- MorphIO: An I/O Reconfiguration Solution for Altera Devices (PDF)
